Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy
نویسندگان
چکیده
منابع مشابه
Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy
Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in dete...
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ژورنال
عنوان ژورنال: Nanoscale Research Letters
سال: 2015
ISSN: 1931-7573,1556-276X
DOI: 10.1186/s11671-015-1062-5